Abstract
In an ion-beam analysis, a sample is bombarded with charged-particle beams and characteristic X-rays (PIXE), nuclear γ-rays (PIGE) or charged particles produced in the target material are measured. A method for deducing a concentration depth profile of an element in the sample from a yield curve of these reaction products as a function of the projectile energy is derived on the basis of the least-squares method. Validity of this method is demonstrated taking an example of PIXE.
Original language | English |
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Pages (from-to) | 151-157 |
Number of pages | 7 |
Journal | Acta Physica Hungarica |
Volume | 65 |
Issue number | 2-3 |
DOIs | |
Publication status | Published - 1989 Jun |
Externally published | Yes |
ASJC Scopus subject areas
- Physics and Astronomy(all)