Depth analysis of a compression layer in chemically strengthened glass using depth-resolved micro-Raman spectroscopy

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Abstract

We performed depth analysis of a compression layer in Corning Gorilla Glass 3, one of commercialized chemically-strengthened glasses, using depth-resolved micro-Raman spectroscopy. We obtained a depth variation of Raman spectra and an ion-exchange rate of Na for K was determined by energy dispersive X-ray spectroscopy.We found that a peak position around 1100cm-1 in the Raman spectra is shifted to higher wavenumber and the ion-exchange rate of Na for K increases with a decreasing depth when shallower than ~30μm. This correlation can be qualitatively explained as follows: compression of a TO2 tetrahedra network (T = Si or Al) induced by the ion exchange gives rise to an increase in frequency of vibrational modes of the TO4 tetrahedra.

Original languageEnglish
Pages (from-to)1164-1166
Number of pages3
JournalJournal of the Ceramic Society of Japan
Volume124
Issue number10
DOIs
Publication statusPublished - 2016 Oct

Keywords

  • Chemically strengthened glass
  • Depth-resolved micro-Raman spectroscopy
  • Energy dispersive X-ray spectroscopy
  • Non-contact inspection

ASJC Scopus subject areas

  • Ceramics and Composites
  • Chemistry(all)
  • Condensed Matter Physics
  • Materials Chemistry

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