Dependence of thin film media microstructure and recording properties on composition of Cr-based very thin seedlayer

Satoru Yoshimura; D. D. Djayaprawira; Masaki Mikami; Migaku Takahashi; Kazuya Komiyama

Dependence of thin film media microstructure and recording properties on composition of Cr-based very thin seedlayer

Satoru Yoshimura, D. D. Djayaprawira, Masaki Mikami, Migaku Takahashi, Kazuya Komiyama

Research output: Contribution to journal › Conference article

Abstract

The dependence of microstructure, magnetic and R/W properties on the melting point of very thin Cr-based seedlayers were discussed. The melting point of the seedlayer was varied from 1600 °C to 3400 °C. Results showed that WCr seedlayer with the thickness of about 1 nm is effective to reduce both the grain size and the media noise in longitudinal media.

Original language	English
Journal	Digests of the Intermag Conference
Publication status	Published - 2002 Dec 1
Event	2002 IEEE International Magnetics Conference-2002 IEEE INTERMAG - Amsterdam, Netherlands Duration: 2002 Apr 28 → 2002 May 2

ASJC Scopus subject areas

Electrical and Electronic Engineering

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Yoshimura, S., Djayaprawira, D. D., Mikami, M., Takahashi, M., & Komiyama, K. (2002). Dependence of thin film media microstructure and recording properties on composition of Cr-based very thin seedlayer. Digests of the Intermag Conference.

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title = "Dependence of thin film media microstructure and recording properties on composition of Cr-based very thin seedlayer",

abstract = "The dependence of microstructure, magnetic and R/W properties on the melting point of very thin Cr-based seedlayers were discussed. The melting point of the seedlayer was varied from 1600 °C to 3400 °C. Results showed that WCr seedlayer with the thickness of about 1 nm is effective to reduce both the grain size and the media noise in longitudinal media.",

author = "Satoru Yoshimura and Djayaprawira, {D. D.} and Masaki Mikami and Migaku Takahashi and Kazuya Komiyama",

year = "2002",

month = dec,

day = "1",

language = "English",

journal = "Digests of the Intermag Conference",

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note = "2002 IEEE International Magnetics Conference-2002 IEEE INTERMAG ; Conference date: 28-04-2002 Through 02-05-2002",

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T1 - Dependence of thin film media microstructure and recording properties on composition of Cr-based very thin seedlayer

AU - Yoshimura, Satoru

AU - Djayaprawira, D. D.

AU - Mikami, Masaki

AU - Takahashi, Migaku

AU - Komiyama, Kazuya

PY - 2002/12/1

Y1 - 2002/12/1

N2 - The dependence of microstructure, magnetic and R/W properties on the melting point of very thin Cr-based seedlayers were discussed. The melting point of the seedlayer was varied from 1600 °C to 3400 °C. Results showed that WCr seedlayer with the thickness of about 1 nm is effective to reduce both the grain size and the media noise in longitudinal media.

AB - The dependence of microstructure, magnetic and R/W properties on the melting point of very thin Cr-based seedlayers were discussed. The melting point of the seedlayer was varied from 1600 °C to 3400 °C. Results showed that WCr seedlayer with the thickness of about 1 nm is effective to reduce both the grain size and the media noise in longitudinal media.

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M3 - Conference article

AN - SCOPUS:0036913109

JO - Digests of the Intermag Conference

JF - Digests of the Intermag Conference

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T2 - 2002 IEEE International Magnetics Conference-2002 IEEE INTERMAG

Y2 - 28 April 2002 through 2 May 2002

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