The dependence of microstructure, magnetic and R/W properties on the melting point of very thin Cr-based seedlayers were discussed. The melting point of the seedlayer was varied from 1600 °C to 3400 °C. Results showed that WCr seedlayer with the thickness of about 1 nm is effective to reduce both the grain size and the media noise in longitudinal media.
|Journal||Digests of the Intermag Conference|
|Publication status||Published - 2002 Dec 1|
|Event||2002 IEEE International Magnetics Conference-2002 IEEE INTERMAG - Amsterdam, Netherlands|
Duration: 2002 Apr 28 → 2002 May 2
ASJC Scopus subject areas
- Electrical and Electronic Engineering