Dependence of thin film media microstructure and recording properties on composition of Cr-based very thin seedlayer

Satoru Yoshimura, D. D. Djayaprawira, Masaki Mikami, Migaku Takahashi, Kazuya Komiyama

    Research output: Contribution to journalConference article

    Abstract

    The dependence of microstructure, magnetic and R/W properties on the melting point of very thin Cr-based seedlayers were discussed. The melting point of the seedlayer was varied from 1600 °C to 3400 °C. Results showed that WCr seedlayer with the thickness of about 1 nm is effective to reduce both the grain size and the media noise in longitudinal media.

    Original languageEnglish
    JournalDigests of the Intermag Conference
    Publication statusPublished - 2002 Dec 1
    Event2002 IEEE International Magnetics Conference-2002 IEEE INTERMAG - Amsterdam, Netherlands
    Duration: 2002 Apr 282002 May 2

    ASJC Scopus subject areas

    • Electrical and Electronic Engineering

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