Dependence of magnetoresistance on thickness and substrate temperature for 82Ni-Fe alloy film

T. Miyazaki, T. Ajima, F. Sato

Research output: Contribution to journalArticle

35 Citations (Scopus)

Abstract

The dependence of magnetoresistance on film thickness and substrate temperature has been studied on 82Ni-Fe alloy films. The anisotropic resistivity Δρ{variant} = ρ{variant} - ρ{variant} is nearly a constant of about 0.64 μΩcm when the thickness of the films is 200 to 1400 Å. An anisotropic magnetoresistivity ratio (Δρ{variant}/ρ{variant}0) of 2.5 to 3% is obtained in the 1000 to 1200 Å thick films prepared at the substrate temperature of 350 °C. The corresponding magnetic properties are Hc = 2 to 2.5 Oe, Hc⊥ = 0.5 to 0.6 Oe, and Hk = 4 Oe. The resistivity decreases with increasing of the film thickness or substrate temperature. The decrease of resistivity ρ{variant}0 can be understood by considering the decrease of diffused scattering at the film surface or grain boundary. The asymmetry of the Δρ{variant}/ρ{variant}0 vs. H curve is also discussed.

Original languageEnglish
Pages (from-to)86-90
Number of pages5
JournalJournal of Magnetism and Magnetic Materials
Volume81
Issue number1-2
DOIs
Publication statusPublished - 1989 Sep

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

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