Dependence of ferroelectric and magnetic properties on measuring temperatures for polycrystalline BiFeO3 films

Hiroshi Naganuma, Yosuke Inoue, Soichiro Okamura

Research output: Contribution to journalArticlepeer-review

13 Citations (Scopus)


A multiferroic BiFeO3 film was fabricated on a Pt/Ti/SiO 2/Si(100) substrate by a chemical solution deposition (CSD) method, and this was followed by postdeposition annealing at 923 K for 10 min in air. X-ray diffraction analysis indicated the formation of the polycrystalline single phase of the BiFeO3 film. A high remanent polarization of 89 μC/cm2 was observed at 90 K together with a relatively low electric coercive field of 0.32 MV/cm, although the ferroelectric hysteresis loops could not be observed at room temperature due to a high leakage current density. The temperature dependence of the ferroelectric hysteresis loops indicated that these hysteresis loops lose their shape above 165 K, and the nominal remanent polarization drastically increased due to the leakage current. Magnetic measurements indicated that the saturation magnetization was less than 1 emu/cm3 at room temperature and increased to approximately 2 emu/cm3 at 100 K, although the spontaneous magnetization could not appear. The magnetization curves of polycrystalline BiFeO3 film were nonlinear at both temperatures, which is different with BiFeO3 single crystal.

Original languageEnglish
Article number4524982
Pages (from-to)1046-1050
Number of pages5
JournalIEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control
Issue number5
Publication statusPublished - 2008 May
Externally publishedYes

ASJC Scopus subject areas

  • Instrumentation
  • Acoustics and Ultrasonics
  • Electrical and Electronic Engineering


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