Dependence of exchange bias field on composition of stabilizing layer and sputtering process in synthetic ferrimagnetic coupled media

D. D. Djayaprawira, K. Komiyama, S. Yoshimura, T. Michalke, M. Takahashi

Research output: Contribution to journalArticle

Abstract

The examination of the effect of exchange field Hex on media properties and the dependence of Hex on composition of stabilizing layers and sputtering process in SF media was presented. Non-textured NiP/Al substrate was used to grow the SF media by DC magnetron sputtering method. The results revealed that to increase Hex, it was necessary to reduce the interface roughness and increase the saturation magnetization of the ferromagnetic layers.

Original languageEnglish
Pages (from-to)396-398
Number of pages3
JournalJournal of Magnetism and Magnetic Materials
Volume239
Issue number1-3
DOIs
Publication statusPublished - 2002 Feb

Keywords

  • Antiferromagnetic coupling
  • Longitudinal thin film media
  • Magnetic recording
  • Synthetic ferrimagnetic
  • Thermal decay

ASJC Scopus subject areas

  • Condensed Matter Physics

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