Density measurement of molten silicon by a pycnometric method

Y. Sato, T. Nishizuka, K. Hara, T. Yamamura, Y. Waseda

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33 Citations (Scopus)

Abstract

The density of molten silicon was measured using a newly developed pycnometer made of boron nitride. The present method has many advantages for measuring the density of molten silicon, which has a high temperature and can be easily oxidized. The pycnometer was precisely machined, and its volume at high temperatures was acculately determined. The procedure to overflow the excess melt was carried out in a closed apparatus under a helium atmosphere. A special procedure was introduced to avoid the error generated by the volume expansion of silicon when it solidified. The total uncertainty of the measurement was estimated to be within 0.5%. The measured density showed a linear relationship with respect to temperature and agreed well with literature values. The expansion coefficient of molten silicon was similar to those of typical molten metals in spite of the low expansion coefficient of solid silicon. This suggested that the structural change of molten silicon was similar to those of typical metals.

Original languageEnglish
Pages (from-to)1463-1471
Number of pages9
JournalInternational Journal of Thermophysics
Volume21
Issue number6
DOIs
Publication statusPublished - 2000 Nov 1

Keywords

  • Density
  • Molten state
  • Pycnometer
  • Semiconductor
  • Silicon

ASJC Scopus subject areas

  • Condensed Matter Physics

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    Sato, Y., Nishizuka, T., Hara, K., Yamamura, T., & Waseda, Y. (2000). Density measurement of molten silicon by a pycnometric method. International Journal of Thermophysics, 21(6), 1463-1471. https://doi.org/10.1023/A:1006661511770