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Degradation of potential barriers in ZnO-based chip varistors due to electrostatic discharge
Sakyo Hirose, Hideaki Niimi, Keisuke Kageyama, Hideharu Ieki, Takahisa Omata, Shinya Otsuka-Yao-Matsuo
Research output: Contribution to journal › Article › peer-review
10
Citations
(Scopus)