Degradation of potential barriers in ZnO-based chip varistors due to electrostatic discharge

Sakyo Hirose, Hideaki Niimi, Keisuke Kageyama, Hideharu Ieki, Takahisa Omata, Shinya Otsuka-Yao-Matsuo

Research output: Contribution to journalArticlepeer-review

10 Citations (Scopus)

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Physics & Astronomy