Deeply trapped electrons in imaging plates and their utilization for extending the dynamic range

Hiroko Yoshida, Yasuhiro Kondo

Research output: Contribution to journalArticlepeer-review

4 Citations (Scopus)

Abstract

The absorption spectra of deep centers in an imaging plate (IP) made of BaFBr0:85I0:15:Eu2 have been studied in the ultraviolet region. Electrons trapped in deep centers are considered to be the cause of unerasable and reappearing latent images in IPs over-irradiated with X-rays. Deep centers showed a dominant peak at around 320 nm, followed by two small peaks at around 345 and 380 nm. By utilizing deeply trapped electrons, we have attempted to extend the dynamic range of an IP. The IP was irradiated by 150-kV X-rays with doses from 8.07 mGy to 80.7 Gy. Reading out the latent image by the stimulation of Eu2 luminescence with a 633-nm HeNe laser light from a conventional Fuji reader showed a linear relationship with irradiated dose up to 0.8 Gy, but then becoming non-linear. After fully erasing with visible light, unerasable latent images were read out using 635-nm semi-conductor laser light combined with a photon-counting detection system. The doseresponse curve so obtained gave a further two orders of magnitude extending the dynamic range up to 80.7 Gy. Comprehensive results indicate that electrons supplied from deep centers to the F centers provided the extended dynamic range after the F centers became saturated. Based on these facts, a model of the excitation of deeply trapped electrons and PSL processes is proposed.

Original languageEnglish
Pages (from-to)468-472
Number of pages5
JournalNuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
Volume621
Issue number1-3
DOIs
Publication statusPublished - 2010 Jul 7

Keywords

  • Deeply trapped electrons
  • Dynamic range
  • Imaging plate
  • Over-irradiated
  • Photostimulated luminescence (PSL)
  • X-ray

ASJC Scopus subject areas

  • Nuclear and High Energy Physics
  • Instrumentation

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