Deconvolution of electron diffraction patterns of amorphous materials formed with convergent beam

W. McBride, D. J.H. Cockayne, K. Tsuda

Research output: Contribution to journalArticlepeer-review

11 Citations (Scopus)

Abstract

To perform reduced density function (G(r)) analysis on electron diffraction patterns of amorphous materials formed with convergent beams, the effects of convergence must be removed from the diffraction data. Assuming electrons incident upon the sample in different directions are incoherent, this can be done using deconvolution (Ultramicroscopy 76 (1999) 115). In this letter we show that the combination of an energy filtering transmission electron microscope with an image plate, increases the accuracy with which diffraction data can be measured and, subsequently, the accuracy of the deconvolution.

Original languageEnglish
Pages (from-to)305-308
Number of pages4
JournalUltramicroscopy
Volume94
Issue number3-4
DOIs
Publication statusPublished - 2003 Apr

Keywords

  • Amorphous
  • Deconvolution
  • Electron diffraction

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Instrumentation

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