DC-biased high-power impedance measurement of planar magnetic cores up to 70 MHz

Masahiro Yamaguchi, U. Erdenebat, K. Suzuki, A. Itagaki, Y. Ishizuka

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

It is necessary to develop a measurement technology of planar magnetic cores at higher frequencies and higher power ranges to develop better power supply on chip (PwrSoc).

Original languageEnglish
Title of host publication2017 IEEE International Magnetics Conference, INTERMAG 2017
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781538610862
DOIs
Publication statusPublished - 2017 Aug 10
Event2017 IEEE International Magnetics Conference, INTERMAG 2017 - Dublin, Ireland
Duration: 2017 Apr 242017 Apr 28

Publication series

Name2017 IEEE International Magnetics Conference, INTERMAG 2017

Other

Other2017 IEEE International Magnetics Conference, INTERMAG 2017
CountryIreland
CityDublin
Period17/4/2417/4/28

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics

Fingerprint Dive into the research topics of 'DC-biased high-power impedance measurement of planar magnetic cores up to 70 MHz'. Together they form a unique fingerprint.

Cite this