Data analysis of X-ray fluorescence holography by subtracting normal component from inverse hologram

Naohisa Happo, Koichi Hayashi, Shinya Hosokawa

Research output: Contribution to journalArticle

14 Citations (Scopus)

Abstract

X-ray fluorescence holography (XFH) is a powerful technique for determining three-dimensional local atomic arrangements around a specific fluorescing element. However, the raw experimental hologram is predominantly a mixed hologram, i.e., a mixture of hologram generated in both normal and inverse modes, which produces unreliable atomic images. In this paper, we propose a practical subtraction method of the normal component from the inverse XFH data by a Fourier transform for the calculated hologram of a model ZnTe cluster. Many spots originating from the normal components could be properly removed using a mask function, and clear atomic images were reconstructed at adequate positions of the model cluster. This method was successtully applied to the analysis of experimental ZnTe single crystal XFH data.

Original languageEnglish
Article number116601
JournalJapanese journal of applied physics
Volume49
Issue number11
DOIs
Publication statusPublished - 2010 Nov 1

ASJC Scopus subject areas

  • Engineering(all)
  • Physics and Astronomy(all)

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