Current-voltage characteristics and layer coupling in amorphous W/Si multilayers

Y. Matsuo, T. Nojima, Y. Kuwasawa, E. Majková, S. Luby

Research output: Contribution to journalArticlepeer-review

6 Citations (Scopus)

Abstract

Current-voltage (I-V) characteristics have been measured on the amorphous W monolayers and W/Si multilayers in the absence of magnetic field. For the monolayers and the multilayers with thick Si layers, the I-V curves show straight lines on a log-log scale and the Kosterlitz-Thouless transition. On the other hand, for the multilayers with thin Si layers, they show negative curvatures on such a scale at low temperatures. This is attributed to the effect of interlayer coupling giving rise to the dimensional crossover of vortex configuration. Our results are discussed with the theories which take the coupling effect into consideration.

Original languageEnglish
Pages (from-to)138-144
Number of pages7
JournalPhysica C: Superconductivity and its applications
Volume277
Issue number1-2
DOIs
Publication statusPublished - 1997 Apr 1
Externally publishedYes

Keywords

  • Amorphous W/Si multilayers
  • I-V characteristics
  • Kosterlitz-Thouless transition
  • Layer coupling

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Energy Engineering and Power Technology
  • Electrical and Electronic Engineering

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