Crystallization in metal-metalloid multilayers

R. Sinclair, T. J. Konno, T. Itoh, N. C. Zhu

Research output: Contribution to journalConference articlepeer-review

Abstract

We have studied the reactions which occur in metal-metalloid multilayers made from elements which have binary eutectic phase diagrams. The metal mediates crystallization of the amorphous as-deposited metalloid by crystal nucleation inside the metal layer followed by rapid diffusion through the metal from amorphous to crystalline phases. The metalloid crystallization temperature is significantly reduced by this reaction. Systems showing this behavior are Al-Si, Ag-Si, Ag-Ge, Co-C, Ni-C and Fe-C. We believe, therefore, that it is a general phenomenon which we have now extended to the case of Ag-SiC.

Original languageEnglish
Pages (from-to)3-8
Number of pages6
JournalMaterials Research Society Symposium - Proceedings
Volume382
Publication statusPublished - 1995 Dec 1
Externally publishedYes
EventProceedings of the 1995 MRS Spring Meeting - San Francisco, CA, USA
Duration: 1995 Apr 171995 Apr 20

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

Fingerprint

Dive into the research topics of 'Crystallization in metal-metalloid multilayers'. Together they form a unique fingerprint.

Cite this