Crystal structure of La4Si2O7N2 analyzed by the Rietveld method using the time-of-flight neutron powder diffraction data

Junichi Takahashi, Hisanori Yamane, Naoto Hirosaki, Yoshinobu Yamamoto, Takayuki Suehiro, Takashi Kamiyama, Masahiko Shimada

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18 Citations (Scopus)

Abstract

The polycrystalline single-phase sample of La4Si2O7N2 was prepared at 1773 and 1873 K by the gas-pressured sintering method. The structure refinement was carried out by the Rietveld method using time-of-flight neutron powder diffraction data measured at 297 K. La4Si2O7N2 is isostructural with the Y4Al2O9 high-temperature phase and crystallizes in a monoclinic cell, P21/c (No. 14-1), Z = 4. The lattice parameters refined for the sample prepared at 1773 K were α = 8.0375(2) Å, b = 10.9900(2) Å, c = 11.1115(2) Å, and β = 110.9214(14)°. Nitrogen atoms statistically occupy the bridging site and the terminal sites of Si2O5N2 ditetrahedra in the La4Si2O7N2 structure. The nonmetal sites surrounded by La atoms only are fully occupied by oxygen atoms.

Original languageEnglish
Pages (from-to)1099-1104
Number of pages6
JournalChemistry of Materials
Volume15
Issue number5
DOIs
Publication statusPublished - 2003 Mar 11

ASJC Scopus subject areas

  • Chemistry(all)
  • Chemical Engineering(all)
  • Materials Chemistry

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