Abstract
xBiCoO3-(1- x)BiFeO3 (x = 0-0.22) films of 400 nm thickness were grown on (100)c SrRuO3 ∥ (100) SrTiO3 substrates by metalorganic chemical vapor deposition. The changes in the crystal structure and electrical properties of the films with x were investigated. The constituent phase changed from rhombohedral to a mixture of rhombohedral and tetragonal, and to tetragonal with increasing x, but the x for this transition is different from that of 200-nm-thick films grown on (100) SrTiO3 substrates. The x of the morphotropic phase boundary that consisted of a mixture of tetragonal and rhombohedral symmetries depended on the film thickness. The remanant polarization continuously decreased with increasing x, in good agreement with the results obtained with the {100}-oriented Pb(Zr,Ti)O3 epitaxial films owing to the decrease in the crystal anisotropy of the films.
Original language | English |
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Pages (from-to) | 7582-7585 |
Number of pages | 4 |
Journal | Japanese journal of applied physics |
Volume | 47 |
Issue number | 9 PART 2 |
DOIs | |
Publication status | Published - 2008 Sep 19 |
Externally published | Yes |
Keywords
- BiCoO-BiFeO solid solution
- Crystal structure
- Electric property
- Epitaxial film
- Lead-free material
- MOCVD
ASJC Scopus subject areas
- Engineering(all)
- Physics and Astronomy(all)