Crystal structure analysis using annular Dark-Field imaging with high precision

K. Kimoto, K. Ishizuka, M. Saito, T. Nagai, X. Yu, R. J. Xie, N. Hirosaki, Y. Matsui

    Research output: Contribution to journalArticlepeer-review

    Original languageEnglish
    Pages (from-to)468-469
    Number of pages2
    JournalMicroscopy and Microanalysis
    Issue numberSUPPL. 2
    Publication statusPublished - 2009 Jul

    ASJC Scopus subject areas

    • Instrumentation

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