Crystal structure analysis using annular Dark-Field imaging with high precision

K. Kimoto, K. Ishizuka, Mitsuhiro Saito, T. Nagai, X. Yu, R. J. Xie, N. Hirosaki, Y. Matsui

    Research output: Contribution to journalArticle

    Original languageEnglish
    Pages (from-to)468-469
    Number of pages2
    JournalMicroscopy and Microanalysis
    Volume15
    Issue numberSUPPL. 2
    DOIs
    Publication statusPublished - 2009 Jul 1

    ASJC Scopus subject areas

    • Instrumentation

    Cite this

    Kimoto, K., Ishizuka, K., Saito, M., Nagai, T., Yu, X., Xie, R. J., Hirosaki, N., & Matsui, Y. (2009). Crystal structure analysis using annular Dark-Field imaging with high precision. Microscopy and Microanalysis, 15(SUPPL. 2), 468-469. https://doi.org/10.1017/S1431927609093179