Crystal structure analysis of Na4Si4-xGex by single crystal X-ray diffraction

Haruhiko Morito; Kenji Momma; Hisanori Yamane

doi:10.1016/j.jallcom.2014.10.165

Crystal structure analysis of Na₄Si_4-_xGe_x by single crystal X-ray diffraction

Haruhiko Morito, Kenji Momma, Hisanori Yamane

Research output: Contribution to journal › Article › peer-review

4 Citations (Scopus)

Abstract

The black platelet or columnar single crystals of Na₄Si_4-_xGe_x (x = 0-4) were obtained by heating a mixture of Si and Ge in a Na melt at 1173 K, followed by slow cooling to room temperature. X-ray diffraction analysis of the single crystals clarified the space groups of Na₄Si_4-_xGe_x with x = 0-2.4 and 2.8-4.0 as C2/c and P2₁/c, respectively. The lattice parameters and cell volume discontinuously changed at around x = 2.6, while the volume of the [Si_4-_xGe_x] tetrahedrons monotonically increased with increase in x. The Si atoms in the Si1 site of Na₄Si₄ were preferentially replaced by Ge atoms.

Original language	English
Pages (from-to)	473-479
Number of pages	7
Journal	Journal of Alloys and Compounds
Volume	623
DOIs	https://doi.org/10.1016/j.jallcom.2014.10.165
Publication status	Published - 2015 Feb 25

Keywords

Crystal structure analysis
Single crystal
Sodium-silicon-germanium

ASJC Scopus subject areas

Mechanics of Materials
Mechanical Engineering
Metals and Alloys
Materials Chemistry

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title = "Crystal structure analysis of Na4Si4-xGex by single crystal X-ray diffraction",

abstract = "The black platelet or columnar single crystals of Na4Si4-xGex (x = 0-4) were obtained by heating a mixture of Si and Ge in a Na melt at 1173 K, followed by slow cooling to room temperature. X-ray diffraction analysis of the single crystals clarified the space groups of Na4Si4-xGex with x = 0-2.4 and 2.8-4.0 as C2/c and P21/c, respectively. The lattice parameters and cell volume discontinuously changed at around x = 2.6, while the volume of the [Si4-xGex] tetrahedrons monotonically increased with increase in x. The Si atoms in the Si1 site of Na4Si4 were preferentially replaced by Ge atoms.",

keywords = "Crystal structure analysis, Single crystal, Sodium-silicon-germanium",

author = "Haruhiko Morito and Kenji Momma and Hisanori Yamane",

note = "Funding Information: This work was supported in part by the Grant-in-Aid for Young Scientists (B) (25820327) from the Ministry of Education, Culture, Sports, Science and Technology. The authors gratefully acknowledge Dr. M. Imai of the National Institute for Materials Science (NIMS) for providing information on the Na–Si binary system. ",

year = "2015",

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doi = "10.1016/j.jallcom.2014.10.165",

language = "English",

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pages = "473--479",

journal = "Journal of Alloys and Compounds",

issn = "0925-8388",

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AU - Morito, Haruhiko

AU - Momma, Kenji

AU - Yamane, Hisanori

N1 - Funding Information: This work was supported in part by the Grant-in-Aid for Young Scientists (B) (25820327) from the Ministry of Education, Culture, Sports, Science and Technology. The authors gratefully acknowledge Dr. M. Imai of the National Institute for Materials Science (NIMS) for providing information on the Na–Si binary system.

PY - 2015/2/25

Y1 - 2015/2/25

N2 - The black platelet or columnar single crystals of Na4Si4-xGex (x = 0-4) were obtained by heating a mixture of Si and Ge in a Na melt at 1173 K, followed by slow cooling to room temperature. X-ray diffraction analysis of the single crystals clarified the space groups of Na4Si4-xGex with x = 0-2.4 and 2.8-4.0 as C2/c and P21/c, respectively. The lattice parameters and cell volume discontinuously changed at around x = 2.6, while the volume of the [Si4-xGex] tetrahedrons monotonically increased with increase in x. The Si atoms in the Si1 site of Na4Si4 were preferentially replaced by Ge atoms.

AB - The black platelet or columnar single crystals of Na4Si4-xGex (x = 0-4) were obtained by heating a mixture of Si and Ge in a Na melt at 1173 K, followed by slow cooling to room temperature. X-ray diffraction analysis of the single crystals clarified the space groups of Na4Si4-xGex with x = 0-2.4 and 2.8-4.0 as C2/c and P21/c, respectively. The lattice parameters and cell volume discontinuously changed at around x = 2.6, while the volume of the [Si4-xGex] tetrahedrons monotonically increased with increase in x. The Si atoms in the Si1 site of Na4Si4 were preferentially replaced by Ge atoms.

KW - Crystal structure analysis

KW - Single crystal

KW - Sodium-silicon-germanium

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