Crystal structure analysis of Na4Si4-xGex by single crystal X-ray diffraction

Haruhiko Morito; Kenji Momma; Hisanori Yamane

doi:10.1016/j.jallcom.2014.10.165

Crystal structure analysis of Na₄Si_4-_xGe_x by single crystal X-ray diffraction

Haruhiko Morito, Kenji Momma, Hisanori Yamane

Materials Property Division

Research output: Contribution to journal › Article › peer-review

4 Citations (Scopus)

Abstract

The black platelet or columnar single crystals of Na₄Si_4-_xGe_x (x = 0-4) were obtained by heating a mixture of Si and Ge in a Na melt at 1173 K, followed by slow cooling to room temperature. X-ray diffraction analysis of the single crystals clarified the space groups of Na₄Si_4-_xGe_x with x = 0-2.4 and 2.8-4.0 as C2/c and P2₁/c, respectively. The lattice parameters and cell volume discontinuously changed at around x = 2.6, while the volume of the [Si_4-_xGe_x] tetrahedrons monotonically increased with increase in x. The Si atoms in the Si1 site of Na₄Si₄ were preferentially replaced by Ge atoms.

Original language	English
Pages (from-to)	473-479
Number of pages	7
Journal	Journal of Alloys and Compounds
Volume	623
DOIs	https://doi.org/10.1016/j.jallcom.2014.10.165
Publication status	Published - 2015 Feb 25

Keywords

Crystal structure analysis
Single crystal
Sodium-silicon-germanium

ASJC Scopus subject areas

Mechanics of Materials
Mechanical Engineering
Metals and Alloys
Materials Chemistry

Access to Document

10.1016/j.jallcom.2014.10.165

Cite this

@article{65f4eba0778f45c0a27acde1df15a532,

title = "Crystal structure analysis of Na4Si4-xGex by single crystal X-ray diffraction",

abstract = "The black platelet or columnar single crystals of Na4Si4-xGex (x = 0-4) were obtained by heating a mixture of Si and Ge in a Na melt at 1173 K, followed by slow cooling to room temperature. X-ray diffraction analysis of the single crystals clarified the space groups of Na4Si4-xGex with x = 0-2.4 and 2.8-4.0 as C2/c and P21/c, respectively. The lattice parameters and cell volume discontinuously changed at around x = 2.6, while the volume of the [Si4-xGex] tetrahedrons monotonically increased with increase in x. The Si atoms in the Si1 site of Na4Si4 were preferentially replaced by Ge atoms.",

keywords = "Crystal structure analysis, Single crystal, Sodium-silicon-germanium",

author = "Haruhiko Morito and Kenji Momma and Hisanori Yamane",

note = "Funding Information: This work was supported in part by the Grant-in-Aid for Young Scientists (B) (25820327) from the Ministry of Education, Culture, Sports, Science and Technology. The authors gratefully acknowledge Dr. M. Imai of the National Institute for Materials Science (NIMS) for providing information on the Na–Si binary system. Publisher Copyright: {\textcopyright} 2014 Elsevier B.V. All rights reserved.",

year = "2015",

month = feb,

day = "25",

doi = "10.1016/j.jallcom.2014.10.165",

language = "English",

volume = "623",

pages = "473--479",

journal = "Journal of Alloys and Compounds",

issn = "0925-8388",

publisher = "Elsevier BV",

}

TY - JOUR

T1 - Crystal structure analysis of Na4Si4-xGex by single crystal X-ray diffraction

AU - Morito, Haruhiko

AU - Momma, Kenji

AU - Yamane, Hisanori

N1 - Funding Information: This work was supported in part by the Grant-in-Aid for Young Scientists (B) (25820327) from the Ministry of Education, Culture, Sports, Science and Technology. The authors gratefully acknowledge Dr. M. Imai of the National Institute for Materials Science (NIMS) for providing information on the Na–Si binary system. Publisher Copyright: © 2014 Elsevier B.V. All rights reserved.

PY - 2015/2/25

Y1 - 2015/2/25

N2 - The black platelet or columnar single crystals of Na4Si4-xGex (x = 0-4) were obtained by heating a mixture of Si and Ge in a Na melt at 1173 K, followed by slow cooling to room temperature. X-ray diffraction analysis of the single crystals clarified the space groups of Na4Si4-xGex with x = 0-2.4 and 2.8-4.0 as C2/c and P21/c, respectively. The lattice parameters and cell volume discontinuously changed at around x = 2.6, while the volume of the [Si4-xGex] tetrahedrons monotonically increased with increase in x. The Si atoms in the Si1 site of Na4Si4 were preferentially replaced by Ge atoms.

AB - The black platelet or columnar single crystals of Na4Si4-xGex (x = 0-4) were obtained by heating a mixture of Si and Ge in a Na melt at 1173 K, followed by slow cooling to room temperature. X-ray diffraction analysis of the single crystals clarified the space groups of Na4Si4-xGex with x = 0-2.4 and 2.8-4.0 as C2/c and P21/c, respectively. The lattice parameters and cell volume discontinuously changed at around x = 2.6, while the volume of the [Si4-xGex] tetrahedrons monotonically increased with increase in x. The Si atoms in the Si1 site of Na4Si4 were preferentially replaced by Ge atoms.

KW - Crystal structure analysis

KW - Single crystal

KW - Sodium-silicon-germanium

UR - http://www.scopus.com/inward/record.url?scp=84918814284&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84918814284&partnerID=8YFLogxK

U2 - 10.1016/j.jallcom.2014.10.165

DO - 10.1016/j.jallcom.2014.10.165

M3 - Article

AN - SCOPUS:84918814284

VL - 623

SP - 473

EP - 479

JO - Journal of Alloys and Compounds

JF - Journal of Alloys and Compounds

SN - 0925-8388

ER -