Crystal structure analysis of Na4Si4-xGex by single crystal X-ray diffraction

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4 Citations (Scopus)

Abstract

The black platelet or columnar single crystals of Na4Si4-xGex (x = 0-4) were obtained by heating a mixture of Si and Ge in a Na melt at 1173 K, followed by slow cooling to room temperature. X-ray diffraction analysis of the single crystals clarified the space groups of Na4Si4-xGex with x = 0-2.4 and 2.8-4.0 as C2/c and P21/c, respectively. The lattice parameters and cell volume discontinuously changed at around x = 2.6, while the volume of the [Si4-xGex] tetrahedrons monotonically increased with increase in x. The Si atoms in the Si1 site of Na4Si4 were preferentially replaced by Ge atoms.

Original languageEnglish
Pages (from-to)473-479
Number of pages7
JournalJournal of Alloys and Compounds
Volume623
DOIs
Publication statusPublished - 2015 Feb 25

Keywords

  • Crystal structure analysis
  • Single crystal
  • Sodium-silicon-germanium

ASJC Scopus subject areas

  • Mechanics of Materials
  • Mechanical Engineering
  • Metals and Alloys
  • Materials Chemistry

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