Abstract
Epitaxial (001)-oriented (1 - x)BiFeO3-xBiCoO3 solid solution films with x = 0-0.33 were grown on (100)SrTiO3 substrates at 700°C by metalorganic chemical vapor deposition. The crystal structure of the films was characterized by high-resolution X-ray diffraction analysis and Raman spectroscopy. Unit cell volume and the lattice parameter were changed with increasing x. The BiFeO3 film with = 0 has rhombohedral symmetry and those with x = 0.16 and 0.21 have a mixture of rhombohedral and tetragonal symmetries. Finally, tetragonal symmetry was observed for the film with x = 0.33 together with a small amount of the contamination phase. This result suggests that the symmetry of (1 - x)BiFeO3-xBiCoO3 films changed from rhombohedral to tetragonal with increasing x similarly to Pb(Zr,Ti)O 3 having a large piezo response.
Original language | English |
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Pages (from-to) | 6948-6951 |
Number of pages | 4 |
Journal | Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers |
Volume | 46 |
Issue number | 10 B |
DOIs | |
Publication status | Published - 2007 Oct 22 |
Externally published | Yes |
Keywords
- BiCoO
- BiFeO
- Crystal structure
- Ferroelectric
- MOCVD
- MPB
- Piezoelectric
- Solid solution
- Tetragonal symmetry
ASJC Scopus subject areas
- Engineering(all)
- Physics and Astronomy(all)