Crystal structure analysis of epitaxial BiFeO3-BiCoO3 solid solution films grown by metalorganic chemical vapor deposition

Shintaro Yasui, Ken Nishida, Hiroshi Naganuma, Soichiro Okamura, Takashi Iijima, Hiroshi Funakubo

Research output: Contribution to journalArticlepeer-review

40 Citations (Scopus)

Abstract

Epitaxial (001)-oriented (1 - x)BiFeO3-xBiCoO3 solid solution films with x = 0-0.33 were grown on (100)SrTiO3 substrates at 700°C by metalorganic chemical vapor deposition. The crystal structure of the films was characterized by high-resolution X-ray diffraction analysis and Raman spectroscopy. Unit cell volume and the lattice parameter were changed with increasing x. The BiFeO3 film with = 0 has rhombohedral symmetry and those with x = 0.16 and 0.21 have a mixture of rhombohedral and tetragonal symmetries. Finally, tetragonal symmetry was observed for the film with x = 0.33 together with a small amount of the contamination phase. This result suggests that the symmetry of (1 - x)BiFeO3-xBiCoO3 films changed from rhombohedral to tetragonal with increasing x similarly to Pb(Zr,Ti)O 3 having a large piezo response.

Original languageEnglish
Pages (from-to)6948-6951
Number of pages4
JournalJapanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
Volume46
Issue number10 B
DOIs
Publication statusPublished - 2007 Oct 22
Externally publishedYes

Keywords

  • BiCoO
  • BiFeO
  • Crystal structure
  • Ferroelectric
  • MOCVD
  • MPB
  • Piezoelectric
  • Solid solution
  • Tetragonal symmetry

ASJC Scopus subject areas

  • Engineering(all)
  • Physics and Astronomy(all)

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