Crystal growth of La2Hf2O7 by micro-pulling-down method using W crucible

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Abstract

La2Hf2O7 crystals with a melting point of ∼2418 °C were grown by the micro-pulling-down method using a W crucible and deoxygenated ZrO2 insulators. A La2Hf2O7 crystal grown at a rate of 0.07 mm/min (LHO[0.07 mm/min]) showed a high transparency without any visible cracks and inclusions, while a La2Hf2O7 crystal grown at a rate of 2.00 mm/min had some cracks. The LHO[0.07 mm/min] crystal had a transmittance of over 70% in the wavelength range of 450–800 nm. The X-ray rocking curve of the LHO[0.07 mm/min] crystal showed a symmetric sharp peak with a full width at half maximum of 138 arcsec. The Laue image revealed that the grown crystals were single crystals.

Original languageEnglish
Article number126547
JournalJournal of Crystal Growth
Volume583
DOIs
Publication statusPublished - 2022 Apr 1

Keywords

  • A2. Growth from melt
  • A2. Single crystal growth
  • B1. Oxides
  • B2. Phosphors

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Inorganic Chemistry
  • Materials Chemistry

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