Crystal growth and structure of fullerene thin films

Katsumi Tanigaki, Sadanori Kuroshima, Thomas W. Ebbesen

Research output: Contribution to journalArticlepeer-review

56 Citations (Scopus)

Abstract

The growth and structure of C60 and C70 thin film crystals on alkali halide and layered material substrates are described. It is demonstrated that fairly large grains can be grown with the specific orientation to the substrate lattice, especially on layered substrates. The defects in the films fabricated on alkali halides are studied by transmission electron microscopy in detail. The growth mechanism of C60 and C70 thin films on these substrates is discussed on a basis of reflection high-energy electron diffraction and atomic force microscopy observation and compared with that on other substrates. The unusual growth characteristics of C60 and C70 are discussed and compared with those encountered in thin films of conventional van der Waals crystals.

Original languageEnglish
Pages (from-to)154-165
Number of pages12
JournalThin Solid Films
Volume257
Issue number2
DOIs
Publication statusPublished - 1995 Mar 1
Externally publishedYes

Keywords

  • Atomic force microscopy
  • Electron microscopy
  • Epitaxy
  • Molecular beam epitaxy

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Metals and Alloys
  • Materials Chemistry

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