Crystal growth and structural characterization of new piezoelectric material La3Ta0.5Ga5.5O14

Hiroaki Takeda, Kazumasa Sugiyama, Katsuhiko Inaba, Kiyoshi Shimamura, Tsuguo Fukuda

Research output: Contribution to journalArticlepeer-review

81 Citations (Scopus)

Abstract

New piezoelectric La3Ta0.5Ga5.5O14 bulk single crystals were grown using the Czochralski technique. The crystal structure (space group P321, a = 8.228(2), c = 5.124(2) angstrom) has been refined using single-crystal X-ray diffraction data with a precision corresponding to an R index of 0.04. Ta atoms were found to be ordered in the octahedral site coordinated by six oxygen atoms.

Original languageEnglish
Pages (from-to)L919-L921
JournalJapanese Journal of Applied Physics, Part 2: Letters
Volume36
Issue number7 B
DOIs
Publication statusPublished - 1997 Jan 1

ASJC Scopus subject areas

  • Engineering(all)
  • Physics and Astronomy (miscellaneous)
  • Physics and Astronomy(all)

Fingerprint Dive into the research topics of 'Crystal growth and structural characterization of new piezoelectric material La<sub>3</sub>Ta<sub>0.5</sub>Ga<sub>5.5</sub>O<sub>14</sub>'. Together they form a unique fingerprint.

Cite this