TY - GEN
T1 - Crystal growth and scintillation properties of Nd-doped Lu 3Al5O12 single crystals
AU - Sugiyama, M.
AU - Fujimoto, Y.
AU - Yanagida, T.
AU - Yokota, Y.
AU - Yoshikawa, A.
PY - 2010
Y1 - 2010
N2 - Scintillation properties of Nd-doped Lu3Al5O 12 (Nd:LuAG) single crystals grown by the micro-pulling down (-PD) method have been studied. The Nd concentration ranged from 0.1 to 3 mol%. The grown crystals were transparent and had a single-phase confirmed by powder XRD measurements. In transmittance spectra, they showed about 80% transmittance down to 300 nm and some weak 4f-4f absorption lines appeared. They showed broad emission peaks due to defects in the host and some sharp peaks due to Nd 3 4f-4f transitions in radioluminescence spectra under 241Am a-ray excitation. Their y-ray-excited decay time profiles consisted of two components as 340-760 ns and 3-5 s. Among them, Nd 0.5%:LuAG exhibited the highest light yield under 137Cs 662 keV excitation and the absolute light yield of this sample was estimated to be 7600 760 photons/MeV.
AB - Scintillation properties of Nd-doped Lu3Al5O 12 (Nd:LuAG) single crystals grown by the micro-pulling down (-PD) method have been studied. The Nd concentration ranged from 0.1 to 3 mol%. The grown crystals were transparent and had a single-phase confirmed by powder XRD measurements. In transmittance spectra, they showed about 80% transmittance down to 300 nm and some weak 4f-4f absorption lines appeared. They showed broad emission peaks due to defects in the host and some sharp peaks due to Nd 3 4f-4f transitions in radioluminescence spectra under 241Am a-ray excitation. Their y-ray-excited decay time profiles consisted of two components as 340-760 ns and 3-5 s. Among them, Nd 0.5%:LuAG exhibited the highest light yield under 137Cs 662 keV excitation and the absolute light yield of this sample was estimated to be 7600 760 photons/MeV.
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U2 - 10.1109/NSSMIC.2010.5873747
DO - 10.1109/NSSMIC.2010.5873747
M3 - Conference contribution
AN - SCOPUS:79960307441
SN - 9781424491063
T3 - IEEE Nuclear Science Symposium Conference Record
SP - 201
EP - 204
BT - IEEE Nuclear Science Symposuim and Medical Imaging Conference, NSS/MIC 2010
T2 - 2010 IEEE Nuclear Science Symposium, Medical Imaging Conference, NSS/MIC 2010 and 17th International Workshop on Room-Temperature Semiconductor X-ray and Gamma-ray Detectors, RTSD 2010
Y2 - 30 October 2010 through 6 November 2010
ER -