Abstract
Single crystals of CuAl(SxSe1-x)2 alloys have been successfully grown by the chemical vapor transport method. Photoreflectance (PR) and photoluminescence (PL) measurements have been carried out at 77 K. From PR measurements, exciton energies (in eV) at 77 K have been obtained as a function of alloy composition x: EA = 3.546x + 2.736(1 - x) - 0.35x(1 - x), EB = 3.709x + 2.849(1 - x) - 0.39x(1 - x), EC = 3.692x + 3.012(1 - x) - 0.33x(1 - x). PL spectra are dominated by a broad emission band centered at 2.0eV, although weak exciton and edge emission (2.9eV) peaks have been observed for 0.84 ≤ x ≤ 0.96 and 0.68 ≤ x ≤ 0.96. respectively.
Original language | English |
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Pages (from-to) | 6645-6649 |
Number of pages | 5 |
Journal | Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers |
Volume | 36 |
Issue number | 11 |
DOIs | |
Publication status | Published - 1997 Nov |
Externally published | Yes |
Keywords
- Chalcopyrite semiconductor
- Chemical vapor transport
- Photoluminescence
- Photoreflectance
- Single crystal of CuAl(SSe) alloy
ASJC Scopus subject areas
- Engineering(all)
- Physics and Astronomy(all)