Crystal growth and dopant segregation of Ce:LiSrAlF 6 and Eu:LiSrAlF 6 crystals with high dopant concentrations

Akihiro Yamaji, Yui Yokota, T. Yanagida, N. Kawaguchi, Y. Futami, Yutaka Fujimoto, Akira Yoshikawa

Research output: Contribution to journalArticlepeer-review

9 Citations (Scopus)


Ce:LiSrAlF 6 and Eu:LiSrAlF 6 crystals with different dopant concentrations were grown by the micro-pulling-down method. The crystals with high dopant crystal included the secondary phase as clusters with the plate shape in BSE images. The secondary phases were identified CeF 3 and EuF 2, respectively, by the EDS analysis and powder-XRD measurement. Eu concentration against the Sr sites in the Eu 2% doped LiSAF crystal were most uniform in the range 0.9-1.6 atm% using the EPMA.

Original languageEnglish
Pages (from-to)106-109
Number of pages4
JournalJournal of Crystal Growth
Issue number1
Publication statusPublished - 2012 Aug 1


  • A1. Doping
  • A1. Segregation
  • A2. Growth from melt
  • B2. Scintillator materials

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Inorganic Chemistry
  • Materials Chemistry

Fingerprint Dive into the research topics of 'Crystal growth and dopant segregation of Ce:LiSrAlF <sub>6</sub> and Eu:LiSrAlF <sub>6</sub> crystals with high dopant concentrations'. Together they form a unique fingerprint.

Cite this