Cross-sectional potential profile across a BaSi2 pn junction by Kelvin probe force microscopy

Daichi Tsukahara, Masakazu Baba, Kentaro Watanabe, Takashi Kimura, Kosuke O. Hara, Weijie Du, Noritaka Usami, Kaoru Toko, Takashi Sekiguchi, Takashi Suemasu

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Engineering & Materials Science

Physics & Astronomy