Critical layer thickness for columnar growth nanostructures of CoPt-based alloy-oxide granular media used for perpendicular magnetic recording

Shingo Sasaki, Yuzo Sasaki, Shin Saito

Research output: Contribution to journalArticle

1 Citation (Scopus)

Abstract

A method for quantitatively determining the critical thickness, dcrit., for columnar growth of a CoPtCr-SiO2 granular layer was evaluated. The value of dcrit can be determined from a plot of the perpendicular magnetic anisotropy energy (Ku) of the layer, Ku × dmag., versus the layer thickness, dmag.. The value of dcrit reflects the structural uniformity of the layer in the thickness direction, and can be used as an index for choosing suitable deposition conditions and the material for the granular layer. Using the proposed method, columnar growth structures can be analyzed by evaluating their magnetic properties and layer thickness without observing cross-sectional TEM images. This inexpensive and simple method can potentially be used to characterize columnar growth structures on the nanometer scale.

Original languageEnglish
Pages (from-to)112-118
Number of pages7
JournalJournal of the Vacuum Society of Japan
Volume60
Issue number3
DOIs
Publication statusPublished - 2017 Jan 1

ASJC Scopus subject areas

  • Materials Science(all)
  • Instrumentation
  • Surfaces and Interfaces
  • Spectroscopy

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