Critical angle behaviour of exchange bias and coercivity with field angle in exchange coupled CoFe/MnIr bilayers

D. Kim; C. Kim; C. Kim; Masakiyo Tsunoda; M. Naka; M. Takahashi

doi:10.1109/INTMAG.2006.374986

Critical angle behaviour of exchange bias and coercivity with field angle in exchange coupled CoFe/MnIr bilayers

D. Kim, C. Kim, C. Kim, Masakiyo Tsunoda, M. Naka, M. Takahashi

ENG - Electronic Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Original language	English
Title of host publication	INTERMAG 2006 - IEEE International Magnetics Conference
Number of pages	1
DOIs	https://doi.org/10.1109/INTMAG.2006.374986
Publication status	Published - 2006 Dec 1
Event	INTERMAG 2006 - IEEE International Magnetics Conference - San Diego, CA, United States Duration: 2006 May 8 → 2006 May 12

Publication series

Name	INTERMAG 2006 - IEEE International Magnetics Conference

Other

Other	INTERMAG 2006 - IEEE International Magnetics Conference
Country	United States
City	San Diego, CA
Period	06/5/8 → 06/5/12

ASJC Scopus subject areas

Electrical and Electronic Engineering
Electronic, Optical and Magnetic Materials

Access to Document

10.1109/INTMAG.2006.374986

Cite this

Kim, D., Kim, C., Kim, C., Tsunoda, M., Naka, M., & Takahashi, M. (2006). Critical angle behaviour of exchange bias and coercivity with field angle in exchange coupled CoFe/MnIr bilayers. In INTERMAG 2006 - IEEE International Magnetics Conference [4262388] (INTERMAG 2006 - IEEE International Magnetics Conference). https://doi.org/10.1109/INTMAG.2006.374986

Critical angle behaviour of exchange bias and coercivity with field angle in exchange coupled CoFe/MnIr bilayers. / Kim, D.; Kim, C.; Kim, C.; Tsunoda, Masakiyo; Naka, M.; Takahashi, M.

INTERMAG 2006 - IEEE International Magnetics Conference. 2006. 4262388 (INTERMAG 2006 - IEEE International Magnetics Conference).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Kim, D, Kim, C, Kim, C, Tsunoda, M, Naka, M & Takahashi, M 2006, Critical angle behaviour of exchange bias and coercivity with field angle in exchange coupled CoFe/MnIr bilayers. in INTERMAG 2006 - IEEE International Magnetics Conference., 4262388, INTERMAG 2006 - IEEE International Magnetics Conference, INTERMAG 2006 - IEEE International Magnetics Conference, San Diego, CA, United States, 06/5/8. https://doi.org/10.1109/INTMAG.2006.374986

@inproceedings{6c71876c442f45b08300731f1e3300a2,

title = "Critical angle behaviour of exchange bias and coercivity with field angle in exchange coupled CoFe/MnIr bilayers",

author = "D. Kim and C. Kim and C. Kim and Masakiyo Tsunoda and M. Naka and M. Takahashi",

year = "2006",

month = dec,

day = "1",

doi = "10.1109/INTMAG.2006.374986",

language = "English",

isbn = "1424414792",

series = "INTERMAG 2006 - IEEE International Magnetics Conference",

booktitle = "INTERMAG 2006 - IEEE International Magnetics Conference",

note = "INTERMAG 2006 - IEEE International Magnetics Conference ; Conference date: 08-05-2006 Through 12-05-2006",

}

TY - GEN

T1 - Critical angle behaviour of exchange bias and coercivity with field angle in exchange coupled CoFe/MnIr bilayers

AU - Kim, D.

AU - Kim, C.

AU - Tsunoda, Masakiyo

AU - Naka, M.

AU - Takahashi, M.

PY - 2006/12/1

Y1 - 2006/12/1

UR - http://www.scopus.com/inward/record.url?scp=50249125327&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=50249125327&partnerID=8YFLogxK

U2 - 10.1109/INTMAG.2006.374986

DO - 10.1109/INTMAG.2006.374986

M3 - Conference contribution

AN - SCOPUS:50249125327

SN - 1424414792

SN - 9781424414796

T3 - INTERMAG 2006 - IEEE International Magnetics Conference

BT - INTERMAG 2006 - IEEE International Magnetics Conference

T2 - INTERMAG 2006 - IEEE International Magnetics Conference

Y2 - 8 May 2006 through 12 May 2006

ER -