Critical angle behaviour of exchange bias and coercivity with field angle in exchange coupled CoFe/MnIr bilayers

D. Kim; C. Kim; C. Kim; M. Tsunoda; M. Naka; Migaku Takahashi

doi:10.1109/INTMAG.2006.374986

Critical angle behaviour of exchange bias and coercivity with field angle in exchange coupled CoFe/MnIr bilayers

D. Kim, C. Kim, C. Kim, M. Tsunoda, M. Naka, Migaku Takahashi

ENG - Electronic Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Original language	English
Title of host publication	INTERMAG 2006 - IEEE International Magnetics Conference
Number of pages	1
DOIs	https://doi.org/10.1109/INTMAG.2006.374986
Publication status	Published - 2006 Dec 1
Event	INTERMAG 2006 - IEEE International Magnetics Conference - San Diego, CA, United States Duration: 2006 May 8 → 2006 May 12

Publication series

Name	INTERMAG 2006 - IEEE International Magnetics Conference

Other

Other	INTERMAG 2006 - IEEE International Magnetics Conference
Country/Territory	United States
City	San Diego, CA
Period	06/5/8 → 06/5/12

ASJC Scopus subject areas

Electrical and Electronic Engineering
Electronic, Optical and Magnetic Materials

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10.1109/INTMAG.2006.374986

Cite this

Critical angle behaviour of exchange bias and coercivity with field angle in exchange coupled CoFe/MnIr bilayers. / Kim, D.; Kim, C.; Kim, C.; Tsunoda, M.; Naka, M.; Takahashi, Migaku.

INTERMAG 2006 - IEEE International Magnetics Conference. 2006. 4262388 (INTERMAG 2006 - IEEE International Magnetics Conference).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Kim, D, Kim, C, Kim, C, Tsunoda, M, Naka, M & Takahashi, M 2006, Critical angle behaviour of exchange bias and coercivity with field angle in exchange coupled CoFe/MnIr bilayers. in INTERMAG 2006 - IEEE International Magnetics Conference., 4262388, INTERMAG 2006 - IEEE International Magnetics Conference, INTERMAG 2006 - IEEE International Magnetics Conference, San Diego, CA, United States, 06/5/8. https://doi.org/10.1109/INTMAG.2006.374986

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title = "Critical angle behaviour of exchange bias and coercivity with field angle in exchange coupled CoFe/MnIr bilayers",

author = "D. Kim and C. Kim and C. Kim and M. Tsunoda and M. Naka and Migaku Takahashi",

year = "2006",

month = dec,

day = "1",

doi = "10.1109/INTMAG.2006.374986",

language = "English",

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booktitle = "INTERMAG 2006 - IEEE International Magnetics Conference",

note = "INTERMAG 2006 - IEEE International Magnetics Conference ; Conference date: 08-05-2006 Through 12-05-2006",

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TY - GEN

T1 - Critical angle behaviour of exchange bias and coercivity with field angle in exchange coupled CoFe/MnIr bilayers

AU - Kim, D.

AU - Kim, C.

AU - Tsunoda, M.

AU - Naka, M.

AU - Takahashi, Migaku

PY - 2006/12/1

Y1 - 2006/12/1

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DO - 10.1109/INTMAG.2006.374986

M3 - Conference contribution

AN - SCOPUS:50249125327

SN - 1424414792

SN - 9781424414796

T3 - INTERMAG 2006 - IEEE International Magnetics Conference

BT - INTERMAG 2006 - IEEE International Magnetics Conference

T2 - INTERMAG 2006 - IEEE International Magnetics Conference

Y2 - 8 May 2006 through 12 May 2006

ER -

Critical angle behaviour of exchange bias and coercivity with field angle in exchange coupled CoFe/MnIr bilayers

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Other

ASJC Scopus subject areas

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