Correlation power analysis using bit-level biased activity plaintexts against AES cores with countermeasures

Daisuke Fujimoto, Noriyuki Miura, Makoto Nagata, Yu-Ichi Hayashi, Naofumi Homma, Takafumi Aoki, Yohei Hori, Toshihiro Katashita, Kazuo Sakiyama, Thanh Ha Le, Julien Bringer, Pirouz Bazargan-Sabet, Shivam Bhasin, Jean Luc Danger

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

Advanced encryption standard (AES) cores suffer from information leakage through power supply currents, even with the wave dynamic differential logic (WDDL) known as one of the most tolerable countermeasure design styles against side channel attacks (SCA). The set of plaintexts having bitlevel biased activities are produced with a known secret key and used for diagnosing the vulnerability of AES cores in their development phases. The CPA with biased plaintexts revealed 128-bit secret keys with less than 4,000 traces from the WDDL AES core both by the measurements and simulations of power supply currents. The core was physically structured by using a 65-nm CMOS standard cell library and assembled on a test vehicle of 'SPACES explorer' having an on-board 1-ohm resistor for measuring power supply currents. The derived knowledge should be useful in driving the design of AES cores to be much less prone to information leakage through power supply current and electromagnetic measurements.

Original languageEnglish
Title of host publicationEMC 2014/Tokyo - 2014 International Symposium on Electromagnetic CompatibiIity, Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages306-309
Number of pages4
ISBN (Electronic)9784885522871
Publication statusPublished - 2014 Dec 23
Event2014 International Symposium on Electromagnetic CompatibiIity, EMC 2014 - Tokyo, Japan
Duration: 2014 May 122014 May 16

Publication series

NameIEEE International Symposium on Electromagnetic Compatibility
Volume2014-December
ISSN (Print)1077-4076
ISSN (Electronic)2158-1118

Other

Other2014 International Symposium on Electromagnetic CompatibiIity, EMC 2014
CountryJapan
CityTokyo
Period14/5/1214/5/16

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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