We investigate the relationship between the magnetoresistance and the interfacial roughness of Co/Cu superlattices whose interface structures are varied by changing sputtering methods, varying sputtering gas pressure and annealing temperatures. X-ray diffraction (XRD) experiments have revealed that the root mean square roughness determined from low-angle XRD spectra is a good measure to evaluate the interfacial roughness which determines the areal occupation of antiferromagnetically coupled regions and the magnetoresistance ratio.
|Number of pages||6|
|Journal||Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers|
|Publication status||Published - 1994 Nov|
ASJC Scopus subject areas
- Physics and Astronomy(all)