Correlation of giant magnetoresistance with interfacial roughness in Co/Cu superlattices

Haruhisa Ueda, Osamu Kitakami, Yutaka Shimada, Yoshinori Goto, Masaki Yamamoto

Research output: Contribution to journalArticle

25 Citations (Scopus)

Abstract

We investigate the relationship between the magnetoresistance and the interfacial roughness of Co/Cu superlattices whose interface structures are varied by changing sputtering methods, varying sputtering gas pressure and annealing temperatures. X-ray diffraction (XRD) experiments have revealed that the root mean square roughness determined from low-angle XRD spectra is a good measure to evaluate the interfacial roughness which determines the areal occupation of antiferromagnetically coupled regions and the magnetoresistance ratio.

Original languageEnglish
Pages (from-to)6173-6178
Number of pages6
JournalJapanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
Volume33
Issue number11
Publication statusPublished - 1994 Nov 1

ASJC Scopus subject areas

  • Engineering(all)
  • Physics and Astronomy(all)

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