Abstract
We investigate the relationship between the magnetoresistance and the interfacial roughness of Co/Cu superlattices whose interface structures are varied by changing sputtering methods, varying sputtering gas pressure and annealing temperatures. X-ray diffraction (XRD) experiments have revealed that the root mean square roughness determined from low-angle XRD spectra is a good measure to evaluate the interfacial roughness which determines the areal occupation of antiferromagnetically coupled regions and the magnetoresistance ratio.
| Original language | English |
|---|---|
| Pages (from-to) | 6173-6178 |
| Number of pages | 6 |
| Journal | Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers |
| Volume | 33 |
| Issue number | 11 |
| Publication status | Published - 1994 Nov 1 |
ASJC Scopus subject areas
- Engineering(all)
- Physics and Astronomy(all)
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Ueda, H., Kitakami, O., Shimada, Y., Goto, Y., & Yamamoto, M. (1994). Correlation of giant magnetoresistance with interfacial roughness in Co/Cu superlattices. Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 33(11), 6173-6178.