Correlation between the location of the interface state minimum at insulator-semiconductor interfaces and schottky barrier heights

Hideo Ohno, Hideki Hasegawa

Research output: Contribution to journalArticle

5 Citations (Scopus)

Abstract

Correlation between the energy location of the minimum density of the interface states in insulator-semiconductor systems and the location of the Fermi level pinning in metal-semiconductor systems is reported. The correlation extends over the major III-V semiconductors, which can be explained by the surface disorder model. The unified defect model is not capable of explaining the present correlation.

Original languageEnglish
Pages (from-to)L353-L356
JournalJapanese journal of applied physics
Volume25
Issue number5
DOIs
Publication statusPublished - 1986 May
Externally publishedYes

ASJC Scopus subject areas

  • Engineering(all)
  • Physics and Astronomy(all)

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