CORRELATION BETWEEN ATOMIC-SCALE STRUCTURES AND ELECTRONIC PROPERTIES AT COMPOUND SEMICONDUCTOR LAYERED INTERFACES.

Hideki Hasegawa, Hideo Ohno, Tetsuya Haga, Yutaka Abe, Heishichirou Takahashi, Takayuki Sawada, Li He, Hirotatsu Ishii

Research output: Chapter in Book/Report/Conference proceedingConference contribution

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Chemical Engineering