Correlation among exchange coupling, surface roughness and junction size in magnetic tunnel junctions

V. K. Sankaranarayanan, Yongkang Hu, Cheolgi Kim, Chong Oh Kim, M. Tsunoda, M. Takahashi

Research output: Contribution to journalArticlepeer-review

1 Citation (Scopus)

Abstract

Magneto-optic Kerr Effect, atomic force microscopy and magnetoresistance measurements have been carried out on as-deposited and annealed magnetic tunnel junctions with junction sizes 180, 250, 320 and 380 μm in order to investigate the correlation among interlayer exchange coupling, surface roughness and junction size. The interlayer exchange coupling (HE) shows very good correlation with surface roughness across the junction in agreement with Neel's orange peel coupling. The normalized HE and Hc values are constant over the junction in larger junctions while tunneling magnetoresistance ratios generally improve with increasing junction size.

Original languageEnglish
Pages (from-to)1965-1966
Number of pages2
JournalJournal of Magnetism and Magnetic Materials
Volume272-276
Issue numberIII
DOIs
Publication statusPublished - 2004 May

Keywords

  • Interlayer exchange coupling
  • Junction size
  • MOKE
  • Magnetic tunnel junctions
  • Surface roughness
  • Tunneling magnetoresistance

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

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