Corner detection using slit rotational edge-feature detector

Yasutaka Etou, Takahiro Sugiyama, Keiichi Abe, Toru Abe

Research output: Contribution to conferencePaperpeer-review

6 Citations (Scopus)

Abstract

Corners in images include useful information and they play an important role in computer vision. However, stable and accurate corner detection is very difficult, because the edges composing a corner break easily around the corner. To overcome this difficulty, a corner detection method using slit rotational edge-feature detector (SRED) has been proposed. By evaluating the edge certainties at each pixel in all directions, this method can detect corners stably. Nevertheless, this method cannot detect the corners in the region of low contrast, and its detection accuracy depends on the edge directions. To solve these problems, we propose a new corner detection method using weighted and interpolated SRED (WI-SRED). By using the edge certainties based on the region separability, the proposed method achieves stable corner detection in the region of low contrast, and moreover, by interpolating and weighting pixels, this method prevents the detection accuracy from depending on the edge directions.

Original languageEnglish
Publication statusPublished - 2002 Jan 1
EventInternational Conference on Image Processing (ICIP'02) - Rochester, NY, United States
Duration: 2002 Sep 222002 Sep 25

Other

OtherInternational Conference on Image Processing (ICIP'02)
CountryUnited States
CityRochester, NY
Period02/9/2202/9/25

ASJC Scopus subject areas

  • Hardware and Architecture
  • Computer Vision and Pattern Recognition
  • Electrical and Electronic Engineering

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