Convergent-beam electron diffraction

Michiyoshi Tanaka, Kenji Tsuda

Research output: Contribution to journalArticlepeer-review

32 Citations (Scopus)

Abstract

This paper reviews the convergent-beam electron diffraction (CBED) technique. Point- and space-group determination methods of ordinary crystals are described, along with an example of the determination method for Sr3Ru2O7. The symmetry determination of one-dimensionally incommensurate crystals and quasicrystals is explained. The large-angle CBED technique, which is indispensable for lattice defect and lattice strain analysis, is also described. A real procedure for lattice strain analysis is provided, using an example of a multilayer Si 1-xGe x/Si material. A nanometer-scale crystal structure refinement method and charge density and crystal potential determination method by CBED are briefly described.

Original languageEnglish
Pages (from-to)S245-S267
JournalJournal of Electron Microscopy
Volume60
Issue numberSUPPL. 1
DOIs
Publication statusPublished - 2011 Aug

Keywords

  • CBED
  • lattice defects
  • point groups
  • space groups
  • strain analysis
  • structure analysis

ASJC Scopus subject areas

  • Instrumentation

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