Convenient method of X-ray absorption spectroscopy using EPMA

Jun Kawai, Kouichi Hayashi

Research output: Contribution to journalArticlepeer-review

6 Citations (Scopus)

Abstract

Fine structures in X-ray fluorescence spectra are explained from the view point of trace analysis. Among these fine structures, the physical processes of the X-ray Raman and radiative Auger effects are explained in detail. The similarity between the radiative Auger effect and X-ray absorption fine structures (XAFS) are described. A novel method to measure the XAFS spectra using the radiative Auger effect is explained; this method has been named EXEFS. Various numerical results of EXEFS Fourier analysis are described with the change of parameters in the numerical analysis. A potential of applying EXEFS method to microbeam analysis is reviewed.

Original languageEnglish
Pages (from-to)353-361
Number of pages9
JournalTetsu-To-Hagane/Journal of the Iron and Steel Institute of Japan
Volume85
Issue number5
DOIs
Publication statusPublished - 1999

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Physical and Theoretical Chemistry
  • Metals and Alloys
  • Materials Chemistry

Fingerprint Dive into the research topics of 'Convenient method of X-ray absorption spectroscopy using EPMA'. Together they form a unique fingerprint.

Cite this