Convenient method of X-ray absorption spectroscopy using EPMA

Jun Kawai, Kouichi Hayashi

Research output: Contribution to journalArticlepeer-review

6 Citations (Scopus)


Fine structures in X-ray fluorescence spectra are explained from the view point of trace analysis. Among these fine structures, the physical processes of the X-ray Raman and radiative Auger effects are explained in detail. The similarity between the radiative Auger effect and X-ray absorption fine structures (XAFS) are described. A novel method to measure the XAFS spectra using the radiative Auger effect is explained; this method has been named EXEFS. Various numerical results of EXEFS Fourier analysis are described with the change of parameters in the numerical analysis. A potential of applying EXEFS method to microbeam analysis is reviewed.

Original languageEnglish
Pages (from-to)353-361
Number of pages9
JournalTetsu-To-Hagane/Journal of the Iron and Steel Institute of Japan
Issue number5
Publication statusPublished - 1999

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Physical and Theoretical Chemistry
  • Metals and Alloys
  • Materials Chemistry


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