Convenient method of X-ray absorption spectroscopy using EPMA

Jun Kawai; Kouichi Hayashi

doi:10.2355/tetsutohagane1955.85.5_353

Convenient method of X-ray absorption spectroscopy using EPMA

Jun Kawai, Kouichi Hayashi

Materials Development Division

Research output: Contribution to journal › Article › peer-review

6 Citations (Scopus)

Abstract

Fine structures in X-ray fluorescence spectra are explained from the view point of trace analysis. Among these fine structures, the physical processes of the X-ray Raman and radiative Auger effects are explained in detail. The similarity between the radiative Auger effect and X-ray absorption fine structures (XAFS) are described. A novel method to measure the XAFS spectra using the radiative Auger effect is explained; this method has been named EXEFS. Various numerical results of EXEFS Fourier analysis are described with the change of parameters in the numerical analysis. A potential of applying EXEFS method to microbeam analysis is reviewed.

Original language	English
Pages (from-to)	353-361
Number of pages	9
Journal	Tetsu-To-Hagane/Journal of the Iron and Steel Institute of Japan
Volume	85
Issue number	5
DOIs	https://doi.org/10.2355/tetsutohagane1955.85.5_353
Publication status	Published - 1999

ASJC Scopus subject areas

Condensed Matter Physics
Physical and Theoretical Chemistry
Metals and Alloys
Materials Chemistry

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abstract = "Fine structures in X-ray fluorescence spectra are explained from the view point of trace analysis. Among these fine structures, the physical processes of the X-ray Raman and radiative Auger effects are explained in detail. The similarity between the radiative Auger effect and X-ray absorption fine structures (XAFS) are described. A novel method to measure the XAFS spectra using the radiative Auger effect is explained; this method has been named EXEFS. Various numerical results of EXEFS Fourier analysis are described with the change of parameters in the numerical analysis. A potential of applying EXEFS method to microbeam analysis is reviewed.",

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AU - Hayashi, Kouichi

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AB - Fine structures in X-ray fluorescence spectra are explained from the view point of trace analysis. Among these fine structures, the physical processes of the X-ray Raman and radiative Auger effects are explained in detail. The similarity between the radiative Auger effect and X-ray absorption fine structures (XAFS) are described. A novel method to measure the XAFS spectra using the radiative Auger effect is explained; this method has been named EXEFS. Various numerical results of EXEFS Fourier analysis are described with the change of parameters in the numerical analysis. A potential of applying EXEFS method to microbeam analysis is reviewed.

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