Abstract
Highly a-plane-oriented Mn3Sn thin films were grown on m-plane sapphire substrates with low-temperature grown Mn3+xSn buffer layers by sputtering deposition technique, and their crystallinity and magnetic properties were investigated by X-ray diffraction and SQUID magnetometer, respectively. The crystallographic orientations of Mn3Sn domains are found to be sensitively influenced by substrate temperature, thickness and composition ratio of Mn3+αSn buffer layer. The highly a-plane-oriented Mn3Sn film shows slightly different magnetization behavior from randomly oriented Mn3Sn film, while the saturation magnetization Ms and coercivity of the highly a-plane-oriented Mn3Sn film are corresponding to that of single crystal bulk.
Original language | English |
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Article number | 035109 |
Journal | AIP Advances |
Volume | 9 |
Issue number | 3 |
DOIs | |
Publication status | Published - 2019 Mar 1 |
ASJC Scopus subject areas
- Physics and Astronomy(all)