Controllable growth of C60 thin films Bi(001)/Si(111) surface

R. Z. Bakhtizin, A. I. Oreshkin, J. T. Sadowski, Y. Fujikawa, Toshio Sakurai

    Research output: Contribution to journalArticle

    Abstract

    Surface morphology and controllable growth of C60 films on a semi-metallic Bi(001)/Si(111) template surface were studied under ultra-high vacuum conditions using scanning tunneling microscopy. Submonolayer, monolayer and thick layer coverage were imaged with atomic resolution. It is shown that the most favorable sites for C60 nucleation are domain boundaries and double steps whereas the surface with one monolayer coverage revealed a characteristic modulation pattern coming from the epitaxial relation between C60 and Bi unit cells.

    Original languageEnglish
    Pages (from-to)417-423
    Number of pages7
    JournalFullerenes Nanotubes and Carbon Nanostructures
    Volume16
    Issue number5-6
    DOIs
    Publication statusPublished - 2008 Sep 1

    Keywords

    • Fullerene C
    • Scanning tunneling microscopy
    • Thin film growth

    ASJC Scopus subject areas

    • Atomic and Molecular Physics, and Optics
    • Materials Science(all)
    • Physical and Theoretical Chemistry
    • Organic Chemistry

    Fingerprint Dive into the research topics of 'Controllable growth of C<sub>60</sub> thin films Bi(001)/Si(111) surface'. Together they form a unique fingerprint.

  • Cite this

    Bakhtizin, R. Z., Oreshkin, A. I., Sadowski, J. T., Fujikawa, Y., & Sakurai, T. (2008). Controllable growth of C60 thin films Bi(001)/Si(111) surface. Fullerenes Nanotubes and Carbon Nanostructures, 16(5-6), 417-423. https://doi.org/10.1080/15363830802281856