Control of magnetic loss profile for RF noise suppression sheets

Shigeyoshi Yoshida, Hiroshi Ono, Shinsuke Ando, Masahiro Yamaguchi, Yutaka Shimada

Research output: Chapter in Book/Report/Conference proceedingConference contribution

5 Citations (Scopus)

Abstract

The ideal frequency profile of magnetic loss μ" for Ihe magnetic composite sheets to be used as high performance RF noise suppressors is a steep rise of at the critical fiequency followed by gradual decay of I/f. We testify that the μ" profile can be improved by combining the multiple elemental dispersion of μ" and applying magnetic field. Furthermore, patterning of the sheets into a stripe anay wotks effectively to reduce the strength of the external field because of enhancement of the shape anisotropy. Consequently μ" profile closer to that of the ideal RF noise suppressor is obtained.

Original languageEnglish
Title of host publicationIEEE International Symposium on Electromagnetic Compatibility
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages962-965
Number of pages4
ISBN (Electronic)0780377796
DOIs
Publication statusPublished - 2003 Jan 1
Event2003 IEEE International Symposium on Electromagnetic Compatibility, EMC 2003 - Istanbul, Turkey
Duration: 2003 May 112003 May 16

Publication series

NameIEEE International Symposium on Electromagnetic Compatibility
Volume2
ISSN (Print)1077-4076
ISSN (Electronic)2158-1118

Other

Other2003 IEEE International Symposium on Electromagnetic Compatibility, EMC 2003
CountryTurkey
CityIstanbul
Period03/5/1103/5/16

Keywords

  • Biasing field
  • Magnetic loss profile
  • Noise suppression sheet
  • Patterned array
  • Transmission characteristics

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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  • Cite this

    Yoshida, S., Ono, H., Ando, S., Yamaguchi, M., & Shimada, Y. (2003). Control of magnetic loss profile for RF noise suppression sheets. In IEEE International Symposium on Electromagnetic Compatibility (pp. 962-965). [1429071] (IEEE International Symposium on Electromagnetic Compatibility; Vol. 2). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ICSMC2.2003.1429071