TY - JOUR
T1 - Continental crust, crustal underplating, and low-Q upper mantle beneath an oceanic island arc
AU - Suyehiro, Kiyoshi
AU - Takahashi, Narumi
AU - Ariie, Yoshiro
AU - Yokoi, Yasutaka
AU - Hino, Ryota
AU - Shinohara, Masanao
AU - Kanazawa, Toshihiko
AU - Hirata, Naoshi
AU - Tokuyama, Hidekazu
AU - Taira, Asahiko
PY - 1996/4/19
Y1 - 1996/4/19
N2 - A detailed structural model of the crust, subducting slab, and underlying upper mantle across the northern Izu-Ogasawara (Bonin) island arc system is derived from a marine seismic reflection and ocean bottom seismographic refraction survey and subsequent forward modeling combined with tomographic inversion. The model indicates that the crust is thickest beneath the presently active rift zone and a granitic crust may have formed in the mid-crust. A highly attenuative mantle (that is, one with low quality Q) seems to be confined mainly beneath the presently active rift zone. In contrast, high P-wave velocity persists in the lower crust between the forearc and eastern margin of the back arc basin, suggesting a large-scale magma input responsible for the arc formation.
AB - A detailed structural model of the crust, subducting slab, and underlying upper mantle across the northern Izu-Ogasawara (Bonin) island arc system is derived from a marine seismic reflection and ocean bottom seismographic refraction survey and subsequent forward modeling combined with tomographic inversion. The model indicates that the crust is thickest beneath the presently active rift zone and a granitic crust may have formed in the mid-crust. A highly attenuative mantle (that is, one with low quality Q) seems to be confined mainly beneath the presently active rift zone. In contrast, high P-wave velocity persists in the lower crust between the forearc and eastern margin of the back arc basin, suggesting a large-scale magma input responsible for the arc formation.
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U2 - 10.1126/science.272.5260.390
DO - 10.1126/science.272.5260.390
M3 - Article
AN - SCOPUS:0029768309
VL - 272
SP - 390
EP - 392
JO - Science
JF - Science
SN - 0036-8075
IS - 5260
ER -