A method for contactless measurement of the conductivity of thin conducting film was demonstrated. In order to apply the technique to on-line testing, a large standoff distance of 35 mm was obtained by using a reflector focusing sensor. The measurement was preformed by using a microwave compact equipment working at 94 GHz which was developed for decreasing the system cost. Indium Tin Oxide films having conductivity of 8.2×104-6.6×105 S/m on the glass substrates were used as the samples. Evaluation equation for determining the conductivity of Indium Tin Oxide films was generated.
|Number of pages||6|
|Journal||International Journal of Modern Physics B|
|Issue number||8-9 II|
|Publication status||Published - 2003 Apr 10|
ASJC Scopus subject areas
- Statistical and Nonlinear Physics
- Condensed Matter Physics