Consideration of the threshold of secondary electrons in photoelectron yield spectroscopy (PYS)

Shinjiro Yagyu, Michiko Yoshitake, Taeyoungand Kim, Toyohiro Chikyow

Research output: Contribution to journalArticlepeer-review

2 Citations (Scopus)

Abstract

The threshold of secondary electrons in photoelectron yield spectroscopy (PYS) was examined using numerical calculations based on Fowler's formula, and was measured on a Cu(111) surface as a function of the surface temperature. In the numerical calculations, the yields are affected by surface temperature at around the threshold. The yield to the power of 1/2 shows a linear relationship of over 0.04 eV per 100 K from the threshold as a function of energy. The estimated threshold shifts to a lower energy with increasing surface temperature, by 0.003 eV per 100 K. The estimated thresholds also decrease with increasing value of the multiplier of n in Fowler's formula. In experiments, the threshold of Cu(111) at room temperature is estimated to be 4.8 eV ± 0.05 eV. The amount of change in the threshold caused by variation in surface temperature is interpreted in terms of the effects of the intrinsic Fowler's formula and lattice expansion.

Original languageEnglish
Pages (from-to)187-190
Number of pages4
JournalJournal of the Vacuum Society of Japan
Volume53
Issue number3
DOIs
Publication statusPublished - 2010

ASJC Scopus subject areas

  • Materials Science(all)
  • Instrumentation
  • Surfaces and Interfaces
  • Spectroscopy

Fingerprint Dive into the research topics of 'Consideration of the threshold of secondary electrons in photoelectron yield spectroscopy (PYS)'. Together they form a unique fingerprint.

Cite this