Consideration of microbump layout for reduction of local bending stress due to CTE Mismatch in 3D IC

Hisashi Kino, Hideto Hashiguchi, Seiya Tanikawa, Yohei Sugawara, Shunsuke Ikegaya, Takafumi Fukushima, Mitsumasa Koyanagi, Tetsu Tanaka

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

Three-dimensional IC (3D IC) has attracted much attention as a promising method to enhance IC performance. Recently, great interests in mechanical reliability are increasing among 3D IC researchers for production of 3D IC. Conventional 3D ICs consist of vertically stacked several thin IC chips those are electrically connected with lots of through-Si vias (TSVs) and metal microbumps. Metal microbumps are surrounded by organic adhesive called underfill material. In general, coefficient of thermal expansion (CTE) of the underfill material is larger than that of metal microbumps. This CTE difference induces local bending stress in thinned IC chips. This local bending stress would affect transistor reliability in thinned IC chips. Therefore, we should suppress the local bending stress to realize 3D IC with high reliability. In this work, we present design guideline of microbump layout which can suppress the local bending stress in 3D-stacked several thin IC chips.

Original languageEnglish
Title of host publication2015 International 3D Systems Integration Conference, 3DIC 2015
PublisherInstitute of Electrical and Electronics Engineers Inc.
PagesTS8.26.1-TS8.26.4
ISBN (Electronic)9781467393850
DOIs
Publication statusPublished - 2015 Nov 20
EventInternational 3D Systems Integration Conference, 3DIC 2015 - Sendai, Japan
Duration: 2015 Aug 312015 Sep 2

Publication series

Name2015 International 3D Systems Integration Conference, 3DIC 2015

Other

OtherInternational 3D Systems Integration Conference, 3DIC 2015
CountryJapan
CitySendai
Period15/8/3115/9/2

Keywords

  • 3D IC
  • local bending stress
  • microbump
  • underfill

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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