Composition dependency of crystal structure, electrical and piezoelectric properties for hydrothermally-synthesized 3 μm-thickness (K xNa1-x)NbO3 films

Takahisa Shiraishi, Hiro Einishi, Shintaro Yasui, Mutsuo Ishikawa, Tomohito Hasegawa, Minoru Kurosawa, Hiroshi Uchida, Yukio Sakashita, Hiroshi Funakubo

Research output: Contribution to journalArticlepeer-review

18 Citations (Scopus)

Abstract

Epitaxial (KxNa1-x)NbO3 films with μm in thickness were deposited at 240°C on (100)cSrRuO 3//(100)SrTiO3 substrates by hydrothermal method. XRD patterns and Raman spectra were systematically changed with increasing x values. XRD patterns and Raman spectra was not dramatically changed by the annealing treatment at 600°C for 10 min under O2 atmosphere. On the other hand, the electrical and piezoelectric properties were improved by this annealing treatment; leakage current density was diminished and longitudinal piezoelectric response was increased to 69pm/V at x = 0.51.

Original languageEnglish
Pages (from-to)627-631
Number of pages5
JournalJournal of the Ceramic Society of Japan
Volume121
Issue number1416
DOIs
Publication statusPublished - 2013 Aug
Externally publishedYes

Keywords

  • Annealing effect
  • Hydrothermal method
  • Piezoelectric property
  • Thick film

ASJC Scopus subject areas

  • Ceramics and Composites
  • Chemistry(all)
  • Condensed Matter Physics
  • Materials Chemistry

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