Comparison of the background corrected valence band XPS spectra of Fe and Co aluminides and silicides with their electronic structures

Masaoki Oku, Toetsu Shishido, Hideyuki Matsuta, Kazuaki Wagatsuma

Research output: Contribution to journalArticle

14 Citations (Scopus)

Abstract

The background corrected valence band XPS spectra and the electronic structures of FeAl, FeSi, CoAl and CoSi were studied. Clean surfaces of the polycrystalline samples were obtained by in situ fracturing of the samples in an XPS spectrometer. The energy loss parts of the Fe 2p, Co 2p and valence band spectra were removed by the deconvolution method using Al 2s or Si 2s spectra as response functions. CoAl exhibited a satellite peak in the Co 2p region, but the other compounds had no clear satellite peaks in the Co 2p and Fe 2p regions. The experimentally background corrected valence band spectra were compared with the calculated spectra using the first-principle band calculation. There were large discrepancies between the spectra above the binding energy of 5 eV. These indicated that the experimental spectra could not be explained by the electronic structures of the ground states alone.

Original languageEnglish
Pages (from-to)75-80
Number of pages6
JournalJournal of Electron Spectroscopy and Related Phenomena
Volume153
Issue number3
DOIs
Publication statusPublished - 2006 Oct 1

Keywords

  • CoAl
  • CoSi
  • Electronic structure
  • FeAl
  • FeSi
  • Valence band XPS spectra

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Radiation
  • Atomic and Molecular Physics, and Optics
  • Condensed Matter Physics
  • Spectroscopy
  • Physical and Theoretical Chemistry

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