TY - JOUR
T1 - Comparison of grazing-exit particle-induced X-ray emission with other related methods
AU - Tsuji, Kouichi
AU - Huisman, Marc
AU - Spolnik, Zoya
AU - Wagatsuma, Kazuaki
AU - Mori, Yoshihiro
AU - Van Grieken, René E.
AU - Vis, Ronald D.
N1 - Funding Information:
K. Tsuji was financially supported by the Japan Society for the Promotion of Science (JSPS) and by Grant-in-Aid (11650828) from the Ministry of Education, Science, Sports and Culture. Z. Spolnik was supported by EU research projects ENV4-CT 95-0104. A part of this work was supported by the Belgium Office for Scientific, Technical and Cultural Affairs under contract MN/10/01.
PY - 2000/7/1
Y1 - 2000/7/1
N2 - Particle-induced X-ray emission (PIXE) is recognized as a trace analysis method; the Bremsstrahlung background, however, still limits the detection power in the low-energy region of spectrum. The grazing-incidence or grazing-exit arrangements are considered to be useful in order to reduce the background intensity. We measure grazing-incidence PIXE (GI-PIXE) and grazing-exit PIXE (GE-PIXE) using an identical sample vacuum chamber to evaluate the performance of both methods. The sample used is a standard sample (Ca, Fe, Ni and Zn) prepared on Si water by the spin-coating method. In GI-PIXE mode, a collimated 2.5 MeV proton beam irradiates the surface of the sample at grazing incident angles. However, it was difficult to reduce sufficiently the background intensity in the GI-PIXE spectra because of the Bremsstrahlung background induced by secondary electrons. In the GE-PIXE mode, proton-induced X-rays are measured at grazing-exit angles. The background intensity is reduced, because only the X-rays emitted from the near-surface layer can be detected in the grazing-exit arrangement. Furthermore, the result obtained for an Au-Cu thin film sample by GE-PIXE method was compared with the result obtained by other related methods: grazing-exit X-ray fluorescence and grazing-exit electron probe microanalysis. Similar results were obtained by different methods, indicating that the same phenomena occur in all grazing-exit X-rays measurements. One of the merits of the grazing-exit microprobe analysis method is in microanalysis using a small diameter electron probe; however, the damage by electron irradiation is more severe than that in GE-PIXE.
AB - Particle-induced X-ray emission (PIXE) is recognized as a trace analysis method; the Bremsstrahlung background, however, still limits the detection power in the low-energy region of spectrum. The grazing-incidence or grazing-exit arrangements are considered to be useful in order to reduce the background intensity. We measure grazing-incidence PIXE (GI-PIXE) and grazing-exit PIXE (GE-PIXE) using an identical sample vacuum chamber to evaluate the performance of both methods. The sample used is a standard sample (Ca, Fe, Ni and Zn) prepared on Si water by the spin-coating method. In GI-PIXE mode, a collimated 2.5 MeV proton beam irradiates the surface of the sample at grazing incident angles. However, it was difficult to reduce sufficiently the background intensity in the GI-PIXE spectra because of the Bremsstrahlung background induced by secondary electrons. In the GE-PIXE mode, proton-induced X-rays are measured at grazing-exit angles. The background intensity is reduced, because only the X-rays emitted from the near-surface layer can be detected in the grazing-exit arrangement. Furthermore, the result obtained for an Au-Cu thin film sample by GE-PIXE method was compared with the result obtained by other related methods: grazing-exit X-ray fluorescence and grazing-exit electron probe microanalysis. Similar results were obtained by different methods, indicating that the same phenomena occur in all grazing-exit X-rays measurements. One of the merits of the grazing-exit microprobe analysis method is in microanalysis using a small diameter electron probe; however, the damage by electron irradiation is more severe than that in GE-PIXE.
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U2 - 10.1016/S0584-8547(00)00148-8
DO - 10.1016/S0584-8547(00)00148-8
M3 - Conference article
AN - SCOPUS:0034227837
VL - 55
SP - 1009
EP - 1016
JO - Spectrochimica Acta - Part B Atomic Spectroscopy
JF - Spectrochimica Acta - Part B Atomic Spectroscopy
SN - 0584-8547
IS - 7
T2 - Colloquium Spectroscopicum Internationale XXXI
Y2 - 5 September 1999 through 10 September 1999
ER -