Comparison of force sensors for atomic force microscopy based on quartz tuning forks and length-extensional resonators

Engineering & Materials Science

• Atomic force microscopy 98%
• Quartz 85%
• Resonators 72%
• Tuning 60%
• Sensors 39%
• Spurious signal noise 17%
• Microscopes 15%
• Thermal noise 14%
• Bandwidth 13%
• Detectors 12%
• Stiffness 11%
• Signal to noise ratio 9%
• Scanning 8%
• Hot Temperature 7%
• Needles 5%
• Mountings 5%

Physics & Astronomy

• forks 100%
• quartz 67%
• tuning 58%
• resonators 58%
• sensors 47%
• bandwidth 14%
• deflection 13%
• stiffness 13%
• microscopes 11%
• thermal noise 11%
• detectors 8%
• signal to noise ratios 8%
• oscillators 7%
• oscillations 6%
• scanning 6%
• mounting 5%
• needles 5%

Chemical Compounds

• Quartz 68%
• Atomic Force Microscopy 61%
• Force 52%
• Tunneling 26%
• Vacuum 10%