Comparative study of scintillation properties of BaF2 and BaMgF4 scintillators using streak camera system equipped with pulsed X-ray source

Yutaka Fujimoto, Takayuki Yanagida, Noriaki Kawaguchi, Kentaro Fukuda

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

By using the micro-pulling down (γ-PD) method, the barium magnesium fluoride (BaMgF4) single crystalline scintillator was produced. The crystal was cut and mirror polished to the physical dimensions of 1× 2× 10 mm3 for examination of optical and scintillation properties. BaMgF4 exhibited more than 70 % transmittance in wavelength range from 170 to 2500 nm, and strong emission peaking around 205 nm was observed under X-ray excitation. The absolute light yield of BaMgF 4 was 1300±100 ph/MeV, and the decay time profile showed two components as 0.45 (76 %) and 1.4 (24 %) ns at room temperature.

Original languageEnglish
Title of host publication2013 IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2013
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Print)9781479905348
DOIs
Publication statusPublished - 2013 Jan 1
Externally publishedYes
Event2013 60th IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2013 - Seoul, Korea, Republic of
Duration: 2013 Oct 272013 Nov 2

Publication series

NameIEEE Nuclear Science Symposium Conference Record
ISSN (Print)1095-7863

Other

Other2013 60th IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2013
CountryKorea, Republic of
CitySeoul
Period13/10/2713/11/2

ASJC Scopus subject areas

  • Radiation
  • Nuclear and High Energy Physics
  • Radiology Nuclear Medicine and imaging

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    Fujimoto, Y., Yanagida, T., Kawaguchi, N., & Fukuda, K. (2013). Comparative study of scintillation properties of BaF2 and BaMgF4 scintillators using streak camera system equipped with pulsed X-ray source. In 2013 IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2013 [6829661] (IEEE Nuclear Science Symposium Conference Record). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/NSSMIC.2013.6829661