Comparative study of NBTI as a function of Si film orientation and thickness in SOI pMOSFETs

Sung Jun Jang, Dae Hyun Ka, Chong Gun Yu, Kwan Su Kim, Won Ju Cho, Jong Tae Park

Research output: Contribution to journalArticlepeer-review

5 Citations (Scopus)

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Physics & Astronomy

Engineering & Materials Science

Chemical Compounds