Combined XPS/UPS/FES for characterisation of electron emission mechanism from diamond

H. Yamaguchi, Y. Kudo, T. Masuzawa, M. Kudo, T. Yamada, Y. Takakuwa, K. Okano

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publicationTechnical Digest of the 20th International Vacuum Nanoelectronics Conference, IVNC 07
Pages18-19
Number of pages2
DOIs
Publication statusPublished - 2007
EventTechnical Digest of the 20th International Vacuum Nanoelectronics Conference, IVNC 07 - Chicago, IL, United States
Duration: 2008 Jul 82008 Jul 12

Publication series

NameTechnical Digest of the 20th International Vacuum Nanoelectronics Conference, IVNC 07

Other

OtherTechnical Digest of the 20th International Vacuum Nanoelectronics Conference, IVNC 07
Country/TerritoryUnited States
CityChicago, IL
Period08/7/808/7/12

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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